"The Effect of Oxide and Nitride Passivation on the Behavior of In-Ga-Zn-O
Thin-Film Transistors under Negative and Positive Bias Illumination Stress: A
Photo-excited Charge Collection Spectroscopic Analysis"
Kwun-Bum Chung, Byung Du Ahn, Joseph Park, and Jin-Seong Park
Published in Journal of Korean Physics Society 59(6) p3376,
2011
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